Below is a listing of projects past and present carried out by the Saint Lucia Bureau of Standards.
Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
60.60 Standard published
Surface chemical analysis — Scanning-probe microscopy — Measurement of drift rate
90.93 Standard confirmed
Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
90.20 Standard under periodical review
Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
90.93 Standard confirmed
Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
60.60 Standard published
Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of arsenic in silicon
90.93 Standard confirmed
Gas analysis — Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
90.60 Close of review
Gas analysis — Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration — Amendment 1: Correction to Formula 5
60.60 Standard published
Surface chemical analysis — Scanning probe microscopy — Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
90.93 Standard confirmed
Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
60.60 Standard published
Surface Chemical Analysis — Atomic force microscopy — Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
90.93 Standard confirmed
Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
90.93 Standard confirmed
Gas analysis — General quality aspects and metrological traceability of calibration gas mixtures
60.60 Standard published
Surface chemical analysis — Secondary-ion mass spectrometry — Determination of boron atomic concentration in silicon using uniformly doped materials
90.60 Close of review
Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials
90.92 Standard to be revised
Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
60.60 Standard published
Surface chemical analysis — Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
90.93 Standard confirmed
Surface chemical analysis — Glow discharge optical emission spectrometry (GD-OES) — Introduction to use
60.60 Standard published