ISO 11952:2014 specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes for measuring geometric quantities at the highest level. It is applicable to those providing further calibrations and is not intended for general industry use, where a lower level of calibration might be required.
WITHDRAWN
ISO 11952:2014
95.99
Withdrawal of Standard
May 21, 2019
PUBLISHED
ISO 11952:2019
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