ISO/NP TS 23879

Nanotechnologies — Structural characterization of graphene oxide flakes: thickness and lateral size measurement using AFM and SEM

General information

Current stage: 10.60 Effective date: Jun 17, 2022

Originator: ISO

Owner: ISO/TC 229

Type: Technical Specification

Scope

This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.

Life cycle

NOW

IN_DEVELOPMENT
ISO/NP TS 23879
10.60 Close of voting
Jun 17, 2022

Preview

Only informative sections of projects are publicly available. To view the full content, you will need to members of the committee. If you are a member, please log in to your account by clicking on the "Log in" button.