ISO/PWI 16887

Microbeam analysis — Analytical electron microscopy — Guidelines of specimen preparation for transmission electron microscope using focused ion beam processing

General information

Current stage: 00.99 Effective date: Mar 18, 2022

Originator: ISO

Owner: ISO/TC 202/SC 3

Type: International Standard

Life cycle

NOW

IN_DEVELOPMENT
ISO/PWI 16887
00.99 Approval to ballot proposal for new project
Mar 18, 2022

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