ISO 17470:2014

Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Publication date: Jan 6, 2014

General information

Current stage: 90.93 Effective date: Jun 6, 2019

Originator: ISO

Owner: ISO/TC 202/SC 2

Type: International Standard

ICS: 71.040.99

Languages: English

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Status: Published

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Scope

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

Life cycle

PREVIOUSLY

Revises
ISO 17470:2004

NOW

PUBLISHED
ISO 17470:2014
90.93 Standard confirmed
Jun 6, 2019

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