ISO 24173:2009

Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction

Publication date: Sep 14, 2009

General information

Current stage: 90.92 Effective date: Mar 10, 2021

Originator: ISO

Owner: ISO/TC 202

Type: International Standard

ICS: 71.040.50

Languages: English French

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Status: Published

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Scope

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

Life cycle

NOW

PUBLISHED
ISO 24173:2009
90.92 Standard to be revised
Mar 10, 2021

REVISED BY

IN_DEVELOPMENT
ISO/CD 24173

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